Predicting Machine Learning Pipeline Runtimes in the Context of Automated Machine Learning

Felix Vivian Mohr; Eyke Hüllermeier; Marcel Wever; Alexander Tornede

doi:10.1109/tpami.2021.3056950

Predicting Machine Learning Pipeline Runtimes in the Context of Automated Machine Learning

Felix Vivian Mohr (First Author)
, Eyke Hüllermeier (Fourth Autor)
, Marcel Wever (Second Author)
, Alexander Tornede (Third Author)

paderborn universit

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Translated title of the contribution	Predicting Machine Learning Pipeline Runtimes in the Context of Automated Machine Learning
Original language	Undefined/Unknown
Pages (from-to)	3055-3066
Number of pages	11
Journal	IEEE Transactions on Pattern Analysis and Machine Intelligence
DOIs	https://doi.org/10.1109/tpami.2021.3056950
State	Published - 18 Jan 2021

Article Classification

Full research article

Indexación Internacional (Artículo)

Ninguno

Scopus-Q Quartil

Q1

ISI- Q Quartil

Ninguno

Categoría Publindex

Ninguno

Access to Document

10.1109/tpami.2021.3056950License: CC BY-ND

https://ieeexplore.ieee.org/document/9347828License: CC BY-ND

Cite this

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title = "Predicting Machine Learning Pipeline Runtimes in the Context of Automated Machine Learning",

author = "Mohr, \{Felix Vivian\} and Eyke H{\"u}llermeier and Marcel Wever and Alexander Tornede",

year = "2021",

month = jan,

day = "18",

doi = "10.1109/tpami.2021.3056950",

language = "Indefinido/desconocido",

pages = "3055--3066",

journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",

issn = "0162-8828",

publisher = "IEEE Computer Society",

}

TY - JOUR

T1 - Predicting Machine Learning Pipeline Runtimes in the Context of Automated Machine Learning

AU - Mohr, Felix Vivian

AU - Wever, Marcel

AU - Tornede, Alexander

A2 - Hüllermeier, Eyke

PY - 2021/1/18

Y1 - 2021/1/18

U2 - 10.1109/tpami.2021.3056950

DO - 10.1109/tpami.2021.3056950

M3 - Artículo

SN - 0162-8828

SP - 3055

EP - 3066

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

ER -